发明名称 |
AUXILIARY SELF-PROTECTING TRANSISTOR STRUCTURE |
摘要 |
This document discusses, among other things, an auxiliary self-protecting transistor circuit, system, and method configured to protect a complementary metal-oxide semiconductor (CMOS) transistor. The auxiliary self-protecting transistor circuit can include an ESD device including a gate terminal, a drain terminal, and a source terminal. The ESD device is configured to be coupled to an isolation region of a complementary metal-oxide semiconductor (CMOS) transistor, and can provide a discharge path between the isolation region of the CMOS transistor and the source terminal of the ESD device. The isolation region of the CMOS transistor can include a blocking junction, such as an n-doped isolation well (niso), a p-type well (pwell), or one or more other blocking junctions. |
申请公布号 |
US2016064920(A1) |
申请公布日期 |
2016.03.03 |
申请号 |
US201514834772 |
申请日期 |
2015.08.25 |
申请人 |
Fairchild Semiconductor Corporation |
发明人 |
Snowdon Kenneth P.;Kang Taeghuyn;Young Alister |
分类号 |
H02H3/20;H01L29/06;H01L27/02 |
主分类号 |
H02H3/20 |
代理机构 |
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代理人 |
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主权项 |
1. An auxiliary self-protecting transistor circuit, comprising:
an electrostatic discharge (ESD) device including a gate terminal, a drain terminal, and a source terminal, wherein the drain terminal of the ESD device is configured to be coupled to an isolation region of a complementary metal-oxide semiconductor (CMOS) transistor, wherein the ESD device is configured to provide a discharge path between the isolation region of the CMOS transistor and the source terminal of the ESD device to protect the CMOS transistor. |
地址 |
San Jose CA US |