发明名称 AUXILIARY SELF-PROTECTING TRANSISTOR STRUCTURE
摘要 This document discusses, among other things, an auxiliary self-protecting transistor circuit, system, and method configured to protect a complementary metal-oxide semiconductor (CMOS) transistor. The auxiliary self-protecting transistor circuit can include an ESD device including a gate terminal, a drain terminal, and a source terminal. The ESD device is configured to be coupled to an isolation region of a complementary metal-oxide semiconductor (CMOS) transistor, and can provide a discharge path between the isolation region of the CMOS transistor and the source terminal of the ESD device. The isolation region of the CMOS transistor can include a blocking junction, such as an n-doped isolation well (niso), a p-type well (pwell), or one or more other blocking junctions.
申请公布号 US2016064920(A1) 申请公布日期 2016.03.03
申请号 US201514834772 申请日期 2015.08.25
申请人 Fairchild Semiconductor Corporation 发明人 Snowdon Kenneth P.;Kang Taeghuyn;Young Alister
分类号 H02H3/20;H01L29/06;H01L27/02 主分类号 H02H3/20
代理机构 代理人
主权项 1. An auxiliary self-protecting transistor circuit, comprising: an electrostatic discharge (ESD) device including a gate terminal, a drain terminal, and a source terminal, wherein the drain terminal of the ESD device is configured to be coupled to an isolation region of a complementary metal-oxide semiconductor (CMOS) transistor, wherein the ESD device is configured to provide a discharge path between the isolation region of the CMOS transistor and the source terminal of the ESD device to protect the CMOS transistor.
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