PLATE-LIKE MEMBER AND MEASUREMENT APPARATUS INCLUDING THE SAME

摘要

A plate-like member includes a sample contact portion that includes first and second surfaces opposite to each other, and a separation portion that includes the first surface and a third surface that is opposite to the first surface. The first surface may receive a terahertz wave, and the second surface may come into contact with a sample during a measurement. The separation portion is configured such that: (i) an acquired time waveform may include only a time waveform of a terahertz wave reflected by the first surface or (ii) a time difference between a first time at which a terahertz wave reflected by the first surface is detected and a second time at which a terahertz wave reflected by the third surface is detected is greater than a time difference between the first time and a time at which a terahertz wave reflected by the second surface is detected.

主权项

1. A plate-like member to be used in a measurement apparatus configured to measure a time waveform of a terahertz wave, the plate-like member comprising:
a sample contact portion including a first surface and a second surface that is opposite to the first surface, the first surface being configured to receive a terahertz wave, the second surface being configured to come into contact with a sample when a measurement is carried out; and a separation portion including the first surface and a third surface that is opposite to the first surface, wherein the separation portion is configured such that a time waveform acquired as the measurement apparatus irradiates the separation portion with a terahertz wave includes only a time waveform of a terahertz wave reflected by the first surface or such that a time difference between a time at which a terahertz wave reflected by the first surface is detected and a time at which a terahertz wave reflected by the third surface is detected is greater than a time difference between the time at which the terahertz wave reflected by the first surface is detected and a time at which a terahertz wave reflected by the second surface is detected.