| 发明名称 |
TEST SYSTEM |
| 摘要 |
Provided is a test system operable with a simplified structure. A test system includes a test device and a test device each of which transports and tests a sample. The test device includes a master control unit, which performs assignment of samples to the test device and the test device, and control of a transport operation of the sample assigned to the test device. The test device includes a slave control unit, which controls a transport operation of the sample assigned to the test device by the master control unit. |
| 申请公布号 |
US2016061851(A1) |
申请公布日期 |
2016.03.03 |
| 申请号 |
US201514834782 |
申请日期 |
2015.08.25 |
| 申请人 |
SYSMEX CORPORATION |
发明人 |
YAMAKAWA Nobuyoshi;TATSUTANI Hiroo;OHMAE Yuichiro |
| 分类号 |
G01N35/00;G01N35/02;G01N35/04;G01N21/78 |
主分类号 |
G01N35/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A test system comprising:
a first test device that transports and tests a sample; and a second test device located adjacent to the first test device that transports and tests a sample, wherein the first test device includes a master control unit that performs assignment of samples to the first test device and the second test device, and controls of a transport operation of the sample assigned to the first test device, and the second test device includes a slave control unit that controls a transport operation of the sample assigned to the second test device by the master control unit. |
| 地址 |
Kobe-shi JP |
