发明名称 |
Structure and Implementation Method for implementing an embedded serial data test loopback, residing directly under the device within a printed circuit board |
摘要 |
A method and a structure with multiple implementations is provided that depends on the specific need, for placing (embedding) a serial loopback circuit of known design in a printed circuit board directly beneath the device under test. Micro-vias and traces connect components including transmitter components (TX) and receiver components (RX) that are formed into a loopback circuit for connection to a device under test (DUT). The connection is accomplished by a coupling capacitor with a shortest possible electrical length approximating a straight line between said components and said DUT and said distance is a length of said short straight line times a square root of 2 so that said receiver components are beneath the DUT. |
申请公布号 |
US2016065334(A1) |
申请公布日期 |
2016.03.03 |
申请号 |
US201514833928 |
申请日期 |
2015.08.24 |
申请人 |
R&D Circuits, Inc. |
发明人 |
Warwick Thomas P.;Russell James V. |
分类号 |
H04L1/24;H04L12/26 |
主分类号 |
H04L1/24 |
代理机构 |
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代理人 |
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主权项 |
1. A structure for placing components directly beneath a surface of a printed circuit board interfacing to a device under test comprising:
micro-vias and traces connecting components including transmitter components (TX) and receiver components (RX) are formed into a loopback circuit for connection to a device under test (DUT) said connecting being accomplished by a coupling capacitor with a shortest possible electrical length approximating a straight line between said components and said distance is a length of said short straight line times a square root of 2 so that said receiver components are beneath the DUT. |
地址 |
South Plainfield NJ US |