发明名称 Structure and Implementation Method for implementing an embedded serial data test loopback, residing directly under the device within a printed circuit board
摘要 A method and a structure with multiple implementations is provided that depends on the specific need, for placing (embedding) a serial loopback circuit of known design in a printed circuit board directly beneath the device under test. Micro-vias and traces connect components including transmitter components (TX) and receiver components (RX) that are formed into a loopback circuit for connection to a device under test (DUT). The connection is accomplished by a coupling capacitor with a shortest possible electrical length approximating a straight line between said components and said DUT and said distance is a length of said short straight line times a square root of 2 so that said receiver components are beneath the DUT.
申请公布号 US2016065334(A1) 申请公布日期 2016.03.03
申请号 US201514833928 申请日期 2015.08.24
申请人 R&D Circuits, Inc. 发明人 Warwick Thomas P.;Russell James V.
分类号 H04L1/24;H04L12/26 主分类号 H04L1/24
代理机构 代理人
主权项 1. A structure for placing components directly beneath a surface of a printed circuit board interfacing to a device under test comprising: micro-vias and traces connecting components including transmitter components (TX) and receiver components (RX) are formed into a loopback circuit for connection to a device under test (DUT) said connecting being accomplished by a coupling capacitor with a shortest possible electrical length approximating a straight line between said components and said distance is a length of said short straight line times a square root of 2 so that said receiver components are beneath the DUT.
地址 South Plainfield NJ US
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