发明名称 半導体装置の製造方法
摘要 A method for manufacturing a semiconductor device, the method comprising, forming a first opening in a first insulating layer provided above a semiconductor substrate, forming a first contact plug by depositing a conductive member in the first opening and removing a part of the conductive member so as to expose the first insulating layer, forming a second insulating layer over the first insulating layer after forming the first contact plug, forming a second opening in the first and second insulating layers without exposing the first contact plug, forming a second contact plug by depositing the conductive member in the second opening and removing a part of the conductive member so as to expose the second insulating layer, and removing the second insulating layer so as to expose the first contact plug after forming the second contact plug.
申请公布号 JP5875368(B2) 申请公布日期 2016.03.02
申请号 JP20110289891 申请日期 2011.12.28
申请人 キヤノン株式会社 发明人 佐野 博晃;岡部 剛士
分类号 H01L21/768;H01L21/28;H01L27/146 主分类号 H01L21/768
代理机构 代理人
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