发明名称 Optically corrective microprobe for white light interferometry
摘要 The probe has a reference beam divider (20) comprising interference filters (21, 22) partially reflecting in short and long-wave spectral regions and for creating transmitted measuring light bundles (M1, M2) and associated reflected reference light bundles (R1, R2). Axial distance between the filters is adjusted so that spectrally involved optical path difference is present in equal size between the reference light bundles. A focusing lens (40) has reduced chromatic aberration so that focusing of the measuring light bundles partially overlap in a desired measuring range for an object surface. Independent claims are also included for the following: (1) an arrangement for white light interferometry (2) a method for manufacturing a dispersion-compensating reference beam divider for two spectral regions of a light beam.
申请公布号 EP2600099(B1) 申请公布日期 2016.03.02
申请号 EP20120195005 申请日期 2012.11.30
申请人 GRINTECH GMBH 发明人 MESSERSCHMIDT, DR. BERNHARD
分类号 G01B9/02;G02B5/20;G02B5/26;G02B5/28;G02B17/00 主分类号 G01B9/02
代理机构 代理人
主权项
地址