发明名称 エッチング方法、これに用いられるシリコンエッチング液、及び半導体基板製品の製造方法
摘要 <P>PROBLEM TO BE SOLVED: To provide a silicon etchant capable of removing silicon and the like with accuracy at high speed with respect to polycrystalline silicon and/or amorphous silicon while maintaining residual electrode members and the like without damage, and an etching method using the same and a semiconductor substrate product using the same. <P>SOLUTION: In an etching method, a silicon etchant containing in an aqueous medium a compound with the carbon number of 3 or more that has an anionic group, nitric acid, and hydrogen fluoride acid, is prepared. The silicon etchant is applied to a silicon film made of polycrystalline silicon and/or amorphous silicon to form an unevenness shape to be a capacitor. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP5873270(B2) 申请公布日期 2016.03.01
申请号 JP20110190144 申请日期 2011.08.31
申请人 富士フイルム株式会社 发明人 室 祐継;稲葉 正;水谷 篤史;吉井 朗子
分类号 H01L21/308;H01L21/306;H01L21/8242;H01L27/108 主分类号 H01L21/308
代理机构 代理人
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