| 摘要 |
The present invention relates to a probe device for deep measurement configured to measure electrical soundness of subjects located in deep or narrow parts of different facilities. The probe device for deep measurement comprises: two probes facing each other; a connector to connect one end of the probes; and elastic electrode panels. The elastic electrode panels are conductor panels formed on inner surfaces of an other end of the probe. In addition, the elastic electrode panels are configured to have curved surfaces have protruding surfaces facing each other. The probe device for deep measurement makes it possible to easily access a subject located in a narrow or a deep groove; fixating the probe device for deep measurement is easy; and the probe device for deep measurement does not damage a surface of a subject through a surface contact thereof. An error is minimized because the surface and elastic contacts thereof allow the probe device for deep measurement to stably touch a subject to offer a reliable measurement result; a structure of the same simple and production costs low; and time for measurement and manpower able to be saved. |
