TESTING AND SETTING PERFORMANCE PARAMETERS IN A SEMICONDUCTOR DEVICE AND METHOD THEREFOR

摘要

A method of determining temperature ranges and setting performance parameters in a semiconductor device that may include at least one temperature sensing circuit is disclosed. The temperature sensing circuits may be used to control various operating parameters to improve the operation of the semiconductor device over a wide temperature range. The performance parameters may be set to improve speed parameters and/or decrease current consumption over a wide range of temperature ranges.

主权项

1. A device, comprising:
a temperature circuit that sets a plurality of temperature ranges; a performance parameter table, the performance parameter table provides performance parameters based on the temperature range in which the device is operating; and performance parameter adjustable circuits coupled to receive the performance parameters and test performance parameters.