发明名称 |
METHOD FOR MANUFACTURING LIQUID DISCHARGE HEAD |
摘要 |
A method for manufacturing a liquid discharge head. The method includes a first step of forming a telecentric measurement pattern A by exposure, the telecentric measurement pattern A being part of a measurement pattern that allows determination of inclination of a principal ray caused by an off-axis telecentric degree occurring in a projection exposing device, and a second step of forming a telecentric measurement pattern B by exposure under an exposure condition defocused from an exposure condition in the first step, the telecentric measurement pattern B being another part of the measurement pattern, which allows the determination of the inclination of the principal ray caused by the off-axis telecentric degree occurring in the projection exposing device. The off-axis telecentric degree is determined from an amount of misalignment between relative forming positions of the telecentric measurement patterns A and B and an amount of defocusing. |
申请公布号 |
US2016052273(A1) |
申请公布日期 |
2016.02.25 |
申请号 |
US201514824954 |
申请日期 |
2015.08.12 |
申请人 |
CANON KABUSHIKI KAISHA |
发明人 |
Manabe Takanobu;Tagawa Yoshinori;Murayama Hiroyuki;Oya Shuhei |
分类号 |
B41J2/16;G03F7/20 |
主分类号 |
B41J2/16 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing a liquid discharge head, the method including a step of forming a discharge port pattern at a layer containing a photosensitive resin material by exposure using a projection exposing device, the method comprising:
a first step of forming a telecentric measurement pattern A by exposure through a mask, the telecentric measurement pattern A being part of a measurement pattern that allows determination of inclination of a principal ray caused by an off-axis telecentric degree occurring in the projection exposing device; and a second step of forming a telecentric measurement pattern B by exposure through a mask under an exposure condition defocused from an exposure condition in the first step, the telecentric measurement pattern B being another part of the measurement pattern, which allows the determination of the inclination of the principal ray caused by the off-axis telecentric degree occurring in the projection exposing device, wherein the off-axis telecentric degree is determined from an amount of misalignment between relative forming positions of the telecentric measurement pattern A and the telecentric measurement pattern B and an amount of defocusing. |
地址 |
Tokyo JP |