发明名称 METHOD FOR MANUFACTURING LIQUID DISCHARGE HEAD
摘要 A method for manufacturing a liquid discharge head. The method includes a first step of forming a telecentric measurement pattern A by exposure, the telecentric measurement pattern A being part of a measurement pattern that allows determination of inclination of a principal ray caused by an off-axis telecentric degree occurring in a projection exposing device, and a second step of forming a telecentric measurement pattern B by exposure under an exposure condition defocused from an exposure condition in the first step, the telecentric measurement pattern B being another part of the measurement pattern, which allows the determination of the inclination of the principal ray caused by the off-axis telecentric degree occurring in the projection exposing device. The off-axis telecentric degree is determined from an amount of misalignment between relative forming positions of the telecentric measurement patterns A and B and an amount of defocusing.
申请公布号 US2016052273(A1) 申请公布日期 2016.02.25
申请号 US201514824954 申请日期 2015.08.12
申请人 CANON KABUSHIKI KAISHA 发明人 Manabe Takanobu;Tagawa Yoshinori;Murayama Hiroyuki;Oya Shuhei
分类号 B41J2/16;G03F7/20 主分类号 B41J2/16
代理机构 代理人
主权项 1. A method for manufacturing a liquid discharge head, the method including a step of forming a discharge port pattern at a layer containing a photosensitive resin material by exposure using a projection exposing device, the method comprising: a first step of forming a telecentric measurement pattern A by exposure through a mask, the telecentric measurement pattern A being part of a measurement pattern that allows determination of inclination of a principal ray caused by an off-axis telecentric degree occurring in the projection exposing device; and a second step of forming a telecentric measurement pattern B by exposure through a mask under an exposure condition defocused from an exposure condition in the first step, the telecentric measurement pattern B being another part of the measurement pattern, which allows the determination of the inclination of the principal ray caused by the off-axis telecentric degree occurring in the projection exposing device, wherein the off-axis telecentric degree is determined from an amount of misalignment between relative forming positions of the telecentric measurement pattern A and the telecentric measurement pattern B and an amount of defocusing.
地址 Tokyo JP