发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 According to an embodiment, a nonvolatile semiconductor memory device comprises: a semiconductor substrate; a first gate insulating film; a floating gate electrode; a second gate insulating film; and a control gate electrode. The first gate insulating film is formed on the semiconductor substrate. The floating gate electrode is formed arranged in a first direction on the first gate insulating film. The second gate insulating film is formed on an upper surface and a side surface of the floating gate electrode. The control gate electrode is formed extending in the first direction and facing the upper surface and the side surface of the floating gate electrode via the second gate insulating film. In addition, the floating gate electrode includes boron. Moreover, a concentration of boron in the floating gate electrode is higher with being further from the semiconductor substrate.
申请公布号 US2016056164(A1) 申请公布日期 2016.02.25
申请号 US201514628628 申请日期 2015.02.23
申请人 Kabushiki Kaisha Toshiba 发明人 Komiya Ken;Mikasa Noriaki
分类号 H01L27/115;H01L21/28;H01L29/49;H01L29/423;H01L29/788;H01L29/66 主分类号 H01L27/115
代理机构 代理人
主权项 1. A nonvolatile semiconductor memory device, comprising: a semiconductor substrate; a first gate insulating film formed on the semiconductor substrate; a floating gate electrode formed arranged in a first direction on the first gate insulating film; a second gate insulating film formed on an upper surface and a side surface of the floating gate electrode; and a control gate electrode extending in the first direction and facing the upper surface and the side surface of the floating gate electrode via the second gate insulating film, the floating gate electrode including boron, and a concentration of boron in the floating gate electrode being higher with being further from the semiconductor substrate.
地址 Minato-ku JP