发明名称 APPARATUS FOR ANALYZING ACTIVE MATERIAL OF SECONDARY BATTERY AND METHOD OF ANALYZING ACTIVE MATERIAL USING THE SAME
摘要 An apparatus for analyzing an active material of a secondary battery may include: a first electrode; a piezoelectric layer on the first electrode; a second electrode on the piezoelectric layer, configured to provide a voltage having a polarity opposite to a polarity of the first electrode; and/or an insulating layer on the second electrode and including a through hole exposing a portion of the second electrode. A method of analyzing an active material of a secondary battery may include: disposing an active material in a through hole of a bulk acoustic resonator, in which a first electrode, a piezoelectric layer, a second electrode, and an insulating layer are stacked; measuring a resonance frequency of the resonator by applying an electric signal to the first and second electrodes of the resonator; and/or measuring a weight of the active material in the through hole, based on the measured resonance frequency.
申请公布号 US2016054267(A1) 申请公布日期 2016.02.25
申请号 US201514734229 申请日期 2015.06.09
申请人 Samsung Electronics Co., Ltd. 发明人 LEE Jooho;LEE Changseung;SHIM Jeoyoung;LEE Sunghee;JEON Woosung
分类号 G01N29/12;G01N29/24;G01R31/36 主分类号 G01N29/12
代理机构 代理人
主权项 1. An apparatus for analyzing an active material of a secondary battery, the apparatus comprising: a first electrode; a piezoelectric layer on the first electrode; a second electrode on the piezoelectric layer, configured to provide a voltage having a polarity opposite to a polarity of the first electrode; and an insulating layer on the second electrode and comprising a first through hole exposing a portion of the second electrode.
地址 Suwon-si KR