发明名称 LOW-STRESS DUAL UNDERFILL PACKAGING
摘要 The present invention relates generally to flip chip technology and more particularly, to a method and structure for reducing internal packaging stresses, improving adhesion properties, and reducing thermal resistance in flip chip packages by using more than one underfill material deposited in different regions of the flip chip interface. According to one embodiment, a method of forming a first underfill in an interior region of an interface such that a periphery region of the interface remains open, and forming a second underfill in the periphery region is disclosed.
申请公布号 US2016049345(A1) 申请公布日期 2016.02.18
申请号 US201514925159 申请日期 2015.10.28
申请人 International Business Machines Corporation 发明人 Brofman Peter J.;Paquet Marie-Claude;Sylvestre Julien
分类号 H01L23/31;H01L23/00;H01L25/065;H01L23/498 主分类号 H01L23/31
代理机构 代理人
主权项
地址 Armonk NY US