发明名称 TEST APPRATUS FOR ELECTRICAL DEVICE
摘要 According to an embodiment of the present invention, a test apparatus for an electrical device, comprises: a printed circuit board connected to an electrical device of an object to be tested; and a means for heat transfer disposed to face a side of the printed circuit board and oil wherein the electrical device can be precipitated accommodated therein. Through the embodiment of the present invention, a moving path of an electric signal with respect to the electrical device of the object to be tested is able to simply be formed, and stray inductance is able to be reduced; thereby enabling a more accurate heat test.
申请公布号 KR20160017502(A) 申请公布日期 2016.02.16
申请号 KR20140101144 申请日期 2014.08.06
申请人 LSIS CO., LTD. 发明人 PARK, YU CHEOL
分类号 G01N25/00;G01R31/26 主分类号 G01N25/00
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