发明名称 |
Solid state imaging device |
摘要 |
A solid-state imaging device having an arrangement in which well contact is achieved for each pixel is provided. In the solid-state imaging device, a well contact part is formed in an activation region of a photoelectric conversion portion. The well contact part fixes a well in which the photoelectric conversion portion and transistors of the pixel are provided at a predetermined potential. |
申请公布号 |
USRE45891(E1) |
申请公布日期 |
2016.02.16 |
申请号 |
US201213631397 |
申请日期 |
2012.09.28 |
申请人 |
Sony Corporation |
发明人 |
Abe Takashi;Suzuki Ryoji;Mabuchi Keiji;Iizuka Tetsuya;Ueno Takahisa;Haruta Tsutomu |
分类号 |
H01L31/062;H01L27/146 |
主分类号 |
H01L31/062 |
代理机构 |
The Chicago Technology Law Group, LLC |
代理人 |
Depke Robert J.;The Chicago Technology Law Group, LLC |
主权项 |
1. A solid-state imaging device comprising:
a pixel array area including pixels arranged in second conductivity type well regions in a two-dimensional array fashion, each of the pixels including: a photoelectric conversion portion including an activation region; and a first impurity region of a first conductivity type and a second impurity region of a second conductivity type provided over the first impurity region; well potential fixing parts for fixing the second conductivity type well regions at a predetermined potential; wherein the photoelectric conversion portion includes a first impurity region of a first conductivity type and a second impurity region of a second conductivity type provided over the first impurity region, and
wherein the well potential fixing parts have an activation region connectedeach connect to a metal wiring from an upper portion of the second conductivity type well region and a third impurity region of second conductivity type, wherein: the photoelectric conversion portion includes a first impurity region of a first conductivity type and a second impurity region of a second conductivity type provided on the first impurity regionand the well potential fixing parts are located in a part of a corresponding photoelectric conversion portion; and each of the well potential fixing parts includes an impurity region of the second conductivity type whose density is higher than the second impurity region. |
地址 |
Tokyo JP |