发明名称 Solid state imaging device
摘要 A solid-state imaging device having an arrangement in which well contact is achieved for each pixel is provided. In the solid-state imaging device, a well contact part is formed in an activation region of a photoelectric conversion portion. The well contact part fixes a well in which the photoelectric conversion portion and transistors of the pixel are provided at a predetermined potential.
申请公布号 USRE45891(E1) 申请公布日期 2016.02.16
申请号 US201213631397 申请日期 2012.09.28
申请人 Sony Corporation 发明人 Abe Takashi;Suzuki Ryoji;Mabuchi Keiji;Iizuka Tetsuya;Ueno Takahisa;Haruta Tsutomu
分类号 H01L31/062;H01L27/146 主分类号 H01L31/062
代理机构 The Chicago Technology Law Group, LLC 代理人 Depke Robert J.;The Chicago Technology Law Group, LLC
主权项 1. A solid-state imaging device comprising: a pixel array area including pixels arranged in second conductivity type well regions in a two-dimensional array fashion, each of the pixels including: a photoelectric conversion portion including an activation region; and a first impurity region of a first conductivity type and a second impurity region of a second conductivity type provided over the first impurity region; well potential fixing parts for fixing the second conductivity type well regions at a predetermined potential; wherein the photoelectric conversion portion includes a first impurity region of a first conductivity type and a second impurity region of a second conductivity type provided over the first impurity region, and wherein the well potential fixing parts have an activation region connectedeach connect to a metal wiring from an upper portion of the second conductivity type well region and a third impurity region of second conductivity type, wherein: the photoelectric conversion portion includes a first impurity region of a first conductivity type and a second impurity region of a second conductivity type provided on the first impurity regionand the well potential fixing parts are located in a part of a corresponding photoelectric conversion portion; and each of the well potential fixing parts includes an impurity region of the second conductivity type whose density is higher than the second impurity region.
地址 Tokyo JP