发明名称 |
Method for coincident alignment of a laser beam and a charged particle beam |
摘要 |
A method and apparatus for aligning a laser beam coincident with a charged particle beam. The invention described provides a method for aligning the laser beam through the center of an objective lens and ultimately targeting the eucentric point of a multi-beam system. The apparatus takes advantage of components of the laser beam alignment system being positioned within and outside of the vacuum chamber of the charged particle system. |
申请公布号 |
US9263235(B2) |
申请公布日期 |
2016.02.16 |
申请号 |
US201414303227 |
申请日期 |
2014.06.12 |
申请人 |
FEI Company |
发明人 |
Straw Marcus;Emerson Mark |
分类号 |
H01J37/00;H01J37/304;H01J37/22;H01J37/305;G21K5/00;G21K5/08 |
主分类号 |
H01J37/00 |
代理机构 |
Scheinberg & Associates, PC |
代理人 |
Scheinberg & Associates, PC ;Scheinberg Michael O.;Calvert Nathan H. |
主权项 |
1. A multi-beam system, comprising:
a vacuum chamber; a workpiece support for supporting a workpiece within the vacuum chamber; a charged particle beam system for generating a beam of charged particles, said beam directed toward the workpiece; a laser beam system for generating a laser beam for processing the workpiece in the vacuum chamber; a focused ion beam system for generating a focused ion beam; an electron beam system for monitoring the material removal process; an objective lens; a laser beam alignment system that allows for the laser beam to be made through the center of the objective lens to target a eucentric point of the workpiece. |
地址 |
Hillsboro OR US |