发明名称 Method for coincident alignment of a laser beam and a charged particle beam
摘要 A method and apparatus for aligning a laser beam coincident with a charged particle beam. The invention described provides a method for aligning the laser beam through the center of an objective lens and ultimately targeting the eucentric point of a multi-beam system. The apparatus takes advantage of components of the laser beam alignment system being positioned within and outside of the vacuum chamber of the charged particle system.
申请公布号 US9263235(B2) 申请公布日期 2016.02.16
申请号 US201414303227 申请日期 2014.06.12
申请人 FEI Company 发明人 Straw Marcus;Emerson Mark
分类号 H01J37/00;H01J37/304;H01J37/22;H01J37/305;G21K5/00;G21K5/08 主分类号 H01J37/00
代理机构 Scheinberg & Associates, PC 代理人 Scheinberg & Associates, PC ;Scheinberg Michael O.;Calvert Nathan H.
主权项 1. A multi-beam system, comprising: a vacuum chamber; a workpiece support for supporting a workpiece within the vacuum chamber; a charged particle beam system for generating a beam of charged particles, said beam directed toward the workpiece; a laser beam system for generating a laser beam for processing the workpiece in the vacuum chamber; a focused ion beam system for generating a focused ion beam; an electron beam system for monitoring the material removal process; an objective lens; a laser beam alignment system that allows for the laser beam to be made through the center of the objective lens to target a eucentric point of the workpiece.
地址 Hillsboro OR US