发明名称 Method, apparatus and system for measuring latency in a physical unit of a circuit
摘要 In an embodiment, an apparatus includes a counter to count between a start value and an end value according to a local clock signal, a first register to store an output of the counter, a mirror elastic buffer to store samples of the counter output received from the first register, where the mirror elastic buffer is to mirror an elastic buffer of a receiver circuit, and a resolution logic to receive a counter output sample from the mirror elastic buffer and a current counter value output from the counter, and to determine a transit latency for a data element to traverse the receiver circuit based at least in part on the counter output sample and the current counter value. Other embodiments are described and claimed.
申请公布号 US9262347(B2) 申请公布日期 2016.02.16
申请号 US201314126926 申请日期 2013.10.30
申请人 Intel Corporation 发明人 Harriman David J.;Wagh Mahesh;Ismail Abdul R.;Froelich Daniel S.
分类号 H04B17/00;G06F13/00 主分类号 H04B17/00
代理机构 Trop, Pruner & Hu, P.C. 代理人 Trop, Pruner & Hu, P.C.
主权项 1. An apparatus comprising: a physical layer unit (PHY) to be coupled to a serial link, the PHY comprising: a receiver path to process data that is to be received via the serial link, wherein the receiver path is to include at least one fixed latency stage that is to be associated with a fixed latency and at least one variable latency stage;variable latency logic to determine a metric that is to be associated with the at least one variable latency stage; andPHY latency logic to determine a PHY latency for the receiver path based on the fixed latency and the metric.
地址 Santa Clara CA US