发明名称 Decoupling MIM capacitor designs for interposers and methods of manufacture thereof
摘要 Decoupling metal-insulator-metal (MIM) capacitor designs for interposers and methods of manufacture thereof are disclosed. In one embodiment, a method of forming a decoupling capacitor includes providing a packaging device, and forming a decoupling MIM capacitor in at least two metallization layers of the packaging device.
申请公布号 US9263415(B2) 申请公布日期 2016.02.16
申请号 US201414265223 申请日期 2014.04.29
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Tzeng Kuo-Chyuan;Tu Kuo-Chi;Wang Chen-Jong;Lee Hsiang-Fan
分类号 H01L23/00;H01L23/14;H01L23/498;H01L49/02;H01L27/06;H01L23/31;H01L23/522;H01L27/08 主分类号 H01L23/00
代理机构 Slater & Matsil, L.L.P. 代理人 Slater & Matsil, L.L.P.
主权项 1. A method for forming a semiconductor device, the method comprising: providing an interposer, the interposer having a first plurality of contact pads and a second plurality of contact pads, the interposer having a decoupling metal-insulator-metal (MIM) capacitor formed thereon, wherein the decoupling MIM capacitor comprises a bottom electrode, a capacitor dielectric over the bottom electrode, and a top electrode over the capacitor dielectric, wherein the interposer comprises a bottom plate pick-up, the bottom plate pick-up being interposed between the bottom electrode and a substrate of the interposer; and mounting an integrated circuit die to the second plurality of contact pads, the decoupling MIM capacitor being electrically interposed between the integrated circuit die and a first contact pad of the first plurality of contact pads.
地址 Hsin-Chu TW