发明名称 Masking Defective Bits in a Storage Array
摘要 A method of failure mapping is provided. The method includes distributing user data throughout a plurality of storage nodes through erasure coding, wherein the plurality of storage nodes are housed within a chassis that couples the storage nodes as a storage cluster. Each of the plurality of storage nodes has a non-volatile solid-state storage with flash memory or other types of non-volatile memory and the user data is accessible via the erasure coding from a remainder of the plurality of storage nodes in event of two of the plurality of storage nodes being unreachable. The method includes determining that a non-volatile memory block in the memory has a defect and generating a mask that indicates the non-volatile memory block and the defect. The method includes reading from the non-volatile memory block with application of the mask, wherein the reading and the application of the mask are performed by the non-volatile solid-state storage.
申请公布号 US2016041869(A1) 申请公布日期 2016.02.11
申请号 US201414454531 申请日期 2014.08.07
申请人 Pure Storage, Inc. 发明人 Davis John D.;Hayes John;Tan Zhangxi;Kannan Hari;Miladinovic Nenad
分类号 G06F11/10;H03M13/05 主分类号 G06F11/10
代理机构 代理人
主权项 1. A method of failure mapping, comprising: distributing user data throughout a plurality of storage nodes through erasure coding, wherein the plurality of storage nodes are housed within a chassis that couples the storage nodes as a storage cluster, wherein each of the plurality of storage nodes has a non-volatile solid-state storage with non-volatile memory; determining that the non-volatile memory has a defect; generating a mask that indicates the defect, the generating based on error correction of reads of the non-volatile solid-state storage, wherein the mask is one of a plurality of masks in a mask hierarchy in the storage cluster; and reading from the non-volatile memory with application of the mask, wherein the reading and the application of the mask are performed by the non-volatile solid-state storage.
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