MASKING DEFECTIVE BITS IN A STORAGE ARRAY

摘要

A method of failure mapping is provided, including distributing user data throughout a plurality of storage nodes through erasure coding. The plurality of storage nodes are housed within a chassis that couples the storage nodes as a storage cluster. Each of the plurality of storage nodes has a non-volatile solid-state storage with flash memory or other types of non-volatile memory. The user data is accessible via the erasure coding from a remainder of the plurality of storage nodes in event of two of the plurality of storage nodes being unreachable. The method includes determining that a non-volatile memory block in the memory has a defect, generating a mask that indicates the non-volatile memory block and defect, and reading from the non-volatile memory block with application of the mask. The reading and application of the mask are performed by the non-volatile solid-state storage.