Process of detection of light and associated device

摘要

According to an aspect of the invention, it is provided a process of detection of light comprising:
- a step of flowing an electric current through at least a first dielectric junction, said first dielectric junction comprising at least a first metallic layer extending along a first reference plane and a second metallic layer extending parallel to said first reference plane, said first and second metallic layers being separated from each other by a dielectric layer ensuring non-ohmic conduction between said first and second metallic layers;
- a step of measuring the electric resistance of the first dielectric junction;
- a step of determining the presence or the absence of light by using the measured electric resistance of the first dielectric junction. According to another aspect of the invention, it is provided a process of characterization of the degree to which detected light is polarized along a first spatial direction and/or along a second spatial direction and/or along a third spatial direction, using a device at the nanometre scale. This enables the detection of the orientation of the incoming light.