发明名称 |
Method for manufacturing all solid-state lithium-ion rechargeable battery, and method for testing all solid-state lithium-ion rechargeable battery |
摘要 |
A method for manufacturing an all solid-state lithium-ion rechargeable battery includes forming a first active material layer on a base, forming a solid electrolyte layer connected to the first active material layer, forming a second active material layer connected to the solid electrolyte layer, and repairing a short-circuit defect produced between the first active material layer and the second active material layer by supplying a repair current between the first active material layer and the second active material layer. |
申请公布号 |
US9257721(B2) |
申请公布日期 |
2016.02.09 |
申请号 |
US201113997958 |
申请日期 |
2011.12.26 |
申请人 |
Mamoru Baba |
发明人 |
Baba Mamoru;Ye Rongbin;Kikuchi Masashi |
分类号 |
H01M10/44;H01M10/0525;H01M10/058;H01M4/04;H01M4/139;H01M10/04;H01M10/052;H01M10/0562;H01M10/0565;H01M10/0585;G01R31/02;G01R31/36 |
主分类号 |
H01M10/44 |
代理机构 |
Schwegman Lundberg & Woessner, P.A. |
代理人 |
Schwegman Lundberg & Woessner, P.A. |
主权项 |
1. A method for manufacturing an all solid-state lithium-ion rechargeable battery, the method comprising: forming a first active material layer on a base; forming a solid electrolyte layer connected to the first active material layer; forming a second active material layer connected to the solid electrolyte layer; and repairing a short-circuit defect produced between the first active material layer and the second active material layer by supplying a repair current between the first active material layer and the second active material layer, wherein in the repairing, only one pulse of the repair current is supplied; wherein the repairing includes supplying current, having a value obtained by multiplying a repair current value of 100 C or greater and 10000 C or less for each short-circuit defect by an estimated short-circuit defect number, to between the first active material layer and the second active material layer. |
地址 |
JP |