发明名称 Sense amplification circuits, output circuits, nonvolatile memory devices, memory systems, memory cards having the same, and data outputting methods thereof
摘要 An output circuit of a nonvolatile memory device includes a sense amplification circuit configured to, during a sensing operation, generate output data based on a comparison between a first voltage on a data line and a reference voltage on a reference data line during a sensing operation, the first voltage corresponding to data read from at least one memory cell, and the sense amplification circuit being further configured to connect the reference data line with a ground terminal during the sensing operation.
申请公布号 US9257181(B2) 申请公布日期 2016.02.09
申请号 US201213427019 申请日期 2012.03.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Lee Taesung;Im Jaewoo
分类号 G11C7/00;G11C16/04;G11C16/26;G11C16/28 主分类号 G11C7/00
代理机构 Harness, Dickey & Pierce, P.L.C. 代理人 Harness, Dickey & Pierce, P.L.C.
主权项 1. An output circuit comprising: a plurality of page buffer latches configured to latch data read from a plurality of memory cells; a plurality of sub data lines configured to receive voltages corresponding to the latched data in response to latch addresses; a data line connected to the plurality of sub data lines; a reference data line to which a current path is formed during a sensing operation; and a sense amplification circuit configured to, during the sensing operation, sense a voltage difference between the reference data line and the data line, and to output data corresponding to the sensed voltage difference.
地址 Gyeonggi-Do KR