发明名称 |
Sense amplification circuits, output circuits, nonvolatile memory devices, memory systems, memory cards having the same, and data outputting methods thereof |
摘要 |
An output circuit of a nonvolatile memory device includes a sense amplification circuit configured to, during a sensing operation, generate output data based on a comparison between a first voltage on a data line and a reference voltage on a reference data line during a sensing operation, the first voltage corresponding to data read from at least one memory cell, and the sense amplification circuit being further configured to connect the reference data line with a ground terminal during the sensing operation. |
申请公布号 |
US9257181(B2) |
申请公布日期 |
2016.02.09 |
申请号 |
US201213427019 |
申请日期 |
2012.03.22 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Lee Taesung;Im Jaewoo |
分类号 |
G11C7/00;G11C16/04;G11C16/26;G11C16/28 |
主分类号 |
G11C7/00 |
代理机构 |
Harness, Dickey & Pierce, P.L.C. |
代理人 |
Harness, Dickey & Pierce, P.L.C. |
主权项 |
1. An output circuit comprising:
a plurality of page buffer latches configured to latch data read from a plurality of memory cells; a plurality of sub data lines configured to receive voltages corresponding to the latched data in response to latch addresses; a data line connected to the plurality of sub data lines; a reference data line to which a current path is formed during a sensing operation; and a sense amplification circuit configured to, during the sensing operation, sense a voltage difference between the reference data line and the data line, and to output data corresponding to the sensed voltage difference. |
地址 |
Gyeonggi-Do KR |