发明名称 SPHERICAL SHAPE MEASUREMENT METHOD AND DEVICE
摘要 PROBLEM TO BE SOLVED: To measure the shape of the whole sphere with high precision.SOLUTION: In a spherical shape measuring method of measuring a plane shape by making a sphere 10 to be measured freely rotatable, measuring partial spherical shapes for each of measurement regions each so set as to have a region overlapping with an adjacent measurement region at each rotational position, and joining respective partial spherical shapes together through a stitching operation based upon shapes of those overlapping regions, the sphere 10 to be measured is enabled to be held on a sphere support base 52 in a state in which the sphere 10 to be measured is detached from a sphere holding mechanism 50 where the sphere 10 to be measured can be freely attached and detached, and is then held again at a different position so as to measure the shape of the whole sphere.SELECTED DRAWING: Figure 5
申请公布号 JP2016023990(A) 申请公布日期 2016.02.08
申请号 JP20140147226 申请日期 2014.07.17
申请人 MITSUTOYO CORP 发明人 HAGINO TAKESHI;YOKOYAMA YUICHIRO;KURIYAMA YUTAKA
分类号 G01B11/24 主分类号 G01B11/24
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