发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device with less occupied area and higher integration degree.SOLUTION: A semiconductor device manufacturing method comprises the steps of: forming a first conductive layer; forming a first insulation layer on the first conductive layer; forming on the first insulation layer, a second conductive layer by using a material the same with that of the first conductive layer; forming a third conductive layer on the second conductive layer; forming a second insulation layer on the third conductive layer; forming a resist mask on the second insulation layer; sequentially performing etching from an upper layer and performing formation of an opening of the first conductive layer and increment of a diameter of an opening of the second conductive layer in the same process; and etching the first insulation layer to form a contact hole which exposes a top face of the first conductive layer.SELECTED DRAWING: Figure 1
申请公布号 JP2016021562(A) 申请公布日期 2016.02.04
申请号 JP20150122222 申请日期 2015.06.17
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 HODO RYOTA;KURATA MOTOMU;SASAGAWA SHINYA
分类号 H01L21/768;H01L21/336;H01L21/822;H01L21/8234;H01L21/8238;H01L23/522;H01L27/04;H01L27/06;H01L27/08;H01L27/088;H01L27/092;H01L29/786 主分类号 H01L21/768
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