发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device with less occupied area and higher integration degree.SOLUTION: A semiconductor device manufacturing method comprises the steps of: forming a first conductive layer; forming a first insulation layer on the first conductive layer; forming on the first insulation layer, a second conductive layer by using a material the same with that of the first conductive layer; forming a third conductive layer on the second conductive layer; forming a second insulation layer on the third conductive layer; forming a resist mask on the second insulation layer; sequentially performing etching from an upper layer and performing formation of an opening of the first conductive layer and increment of a diameter of an opening of the second conductive layer in the same process; and etching the first insulation layer to form a contact hole which exposes a top face of the first conductive layer.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016021562(A) |
申请公布日期 |
2016.02.04 |
申请号 |
JP20150122222 |
申请日期 |
2015.06.17 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
HODO RYOTA;KURATA MOTOMU;SASAGAWA SHINYA |
分类号 |
H01L21/768;H01L21/336;H01L21/822;H01L21/8234;H01L21/8238;H01L23/522;H01L27/04;H01L27/06;H01L27/08;H01L27/088;H01L27/092;H01L29/786 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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