发明名称 APPARATUS AND METHODS FOR TREATING SUBSTRATES
摘要 The present invention relates to an apparatus and a method for treating a substrate. The apparatus for treating a substrate includes a spin chuck which supports a substrate; a first nozzle which is movable on a surface of the substrate, and provides liquid drops of a process solution on the surface of the substrate; a nozzle arm which moves the first nozzle on the surface of the substrate; and a second nozzle which provides a wetting solution onto the surface of the substrate and forms a wetting layer. The second nozzle is vertically moved with the first nozzle. The thickness of the wetting layer is changed as the second nozzle vertically moves.
申请公布号 KR20160013469(A) 申请公布日期 2016.02.04
申请号 KR20140094987 申请日期 2014.07.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, KYOUNG SEOB;KO, YOUNG SUN;KIM, KYOUNG HWAN;KIM, SEOK HOON;LEE, KUN TACK;LEE, HYO SAN
分类号 H01L21/302;H01L21/02;H01L21/683 主分类号 H01L21/302
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