发明名称 |
RUGGED SEMICONDUCTOR RADIATION DETECTOR |
摘要 |
Devices and methods for a rugged semiconductor radiation detector are provided. The semiconductor detector may include a hermetically sealed housing and a semiconductor disposed within the housing that has a first surface and a second surface opposite one another. A first metallization layer may at least partially cover the first surface of the semiconductor and a second metallization layer may at least partially cover the second surface of the semiconductor. The first metallization layer or the second metallization layer, or both, do not extend completely to an edge of the semiconductor, thereby providing a nonconductive buffer zone. This reduces electrical field stresses that occur when a voltage potential is applied between the first metallization layer and the second metallization layer and reduces a likelihood of electrical failure (e.g., due to arcing). |
申请公布号 |
WO2016018676(A1) |
申请公布日期 |
2016.02.04 |
申请号 |
WO2015US41359 |
申请日期 |
2015.07.21 |
申请人 |
SCHLUMBERGER CANADA LIMITED;SERVICES PETROLIERS SCHLUMBERGER;SCHLUMBERGER HOLDINGS LIMITED;SCHLUMBERGER TECHNOLOGY B.V.;PRAD RESEARCH AND DEVELOPMENT LIMITED;SCHLUMBERGER TECHNOLOGY CORPORATION |
发明人 |
GICQUEL, FREDERIC;PHILIP, OLIVER G.;STOLLER, CHRISTIAN;ZHOU, ZILU |
分类号 |
G01V5/06;G01T1/24;G01V5/10 |
主分类号 |
G01V5/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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