发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device capable of a fast operation; and provide a semiconductor device which is unlikely to cause fluctuation in electrical characteristics due to short-channel effects.SOLUTION: A transistor comprises: a semiconductor layer formed by using a crystalline oxide semiconductor; a channel formation region, a source region and a drain region which are formed in the semiconductor layer. The source region and drain region are formed in a self-alignment process of adding one of or a plurality of group 15 elements to the semiconductor layer by using a gate electrode as a mask. A wurtzite type crystalline structure can be provided to the source region and the drain region.SELECTED DRAWING: Figure 1
申请公布号 JP2016021581(A) 申请公布日期 2016.02.04
申请号 JP20150163953 申请日期 2015.08.21
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI
分类号 H01L29/786;C23C14/08;H01L21/8242;H01L21/8244;H01L27/10;H01L27/108;H01L27/11 主分类号 H01L29/786
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