发明名称 移動体端末試験装置および試験方法
摘要 A mobile terminal test device includes a frame structure storage unit that stores a plurality of frame structure information items indicating the allocation patterns of a downlink (DL) and an uplink (UL) to a predetermined number of sub-frames forming one TDD frame, a scenario processing unit 24 including means for designating the type of frame used for a throughput test, and a timing control unit 27 that determines at least one of UL sub-frames in the designated type of frame as a response start sub-frame for returning acknowledgement/negative-acknowledgement messages from a mobile terminal 1 with reference to the frame structure information corresponding to the designated type of frame and determines at least one of DL sub-frames that are a predetermined number of sub-frames before the response start sub-frame as a transmission start sub-frame. The DL throughput of an arbitrarily designated type of frame is accurately calculated.
申请公布号 JP5851482(B2) 申请公布日期 2016.02.03
申请号 JP20130263355 申请日期 2013.12.20
申请人 アンリツ株式会社 发明人 音成 伸俊;藤樫 晴之
分类号 H04J3/00;H04W88/02 主分类号 H04J3/00
代理机构 代理人
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