发明名称 半導体装置の検査方法
摘要 A method for limiting writing of data to a specific memory cell without disconnecting a wiring of a memory cell array or placing a prober in contact with a memory cell, a row, or a column is provided. Row address data and column address data of a memory cell to which data cannot be written are stored in a register. Enable data which controls data writing is stored in the register. Next, in order to write data to a memory cell, row address data and column address data of a memory cell to which data is written, writing enable data, and the like are output from a logic circuit; thus, writing of data to a memory cell corresponding to the address data stored in the register is inhibited.
申请公布号 JP5852809(B2) 申请公布日期 2016.02.03
申请号 JP20110179361 申请日期 2011.08.19
申请人 株式会社半導体エネルギー研究所 发明人 米田 誠一
分类号 G11C29/00;G11C29/12 主分类号 G11C29/00
代理机构 代理人
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