发明名称 |
Positive resist composition and patterning process |
摘要 |
A positive resist composition is provided comprising a polymer comprising recurring units having a carboxyl or phenolic hydroxyl group substituted with an acid labile group and recurring units of 2-pyrone ester, and having a Mw of 1,000-500,000. The resist composition has a satisfactory effect of suppressing acid diffusion and a high resolution, and forms a pattern of good profile and minimal edge roughness after exposure. |
申请公布号 |
US9250522(B2) |
申请公布日期 |
2016.02.02 |
申请号 |
US201514636590 |
申请日期 |
2015.03.03 |
申请人 |
SHIN-ETSU CHEMICAL CO., LTD. |
发明人 |
Hatakeyama Jun;Hasegawa Koji;Sagehashi Masayoshi |
分类号 |
G03F7/039;G03F7/20;G03F7/30;C08F220/30;C08F216/10;C08F220/68;C08F224/00 |
主分类号 |
G03F7/039 |
代理机构 |
Westerman, Hattori, Daniels & Adrian, LLP |
代理人 |
Westerman, Hattori, Daniels & Adrian, LLP |
主权项 |
1. A positive resist composition comprising a polymer comprising recurring units having a carboxyl and/or phenolic hydroxyl group substituted with an acid labile group and recurring units (a) having a 2-pyrone ester, represented by the general formula (1), and having a weight average molecular weight of 1,000 to 500,000 as a base resin, wherein R1 is hydrogen or methyl, R2 is methyl or ethyl, and X is (1) a single bond, (2) a C1-C12 linking group having an ester radical, ether radical or lactone ring, (3) phenylene group or (4) naphthylene group. |
地址 |
Tokyo JP |