发明名称 Positive resist composition and patterning process
摘要 A positive resist composition is provided comprising a polymer comprising recurring units having a carboxyl or phenolic hydroxyl group substituted with an acid labile group and recurring units of 2-pyrone ester, and having a Mw of 1,000-500,000. The resist composition has a satisfactory effect of suppressing acid diffusion and a high resolution, and forms a pattern of good profile and minimal edge roughness after exposure.
申请公布号 US9250522(B2) 申请公布日期 2016.02.02
申请号 US201514636590 申请日期 2015.03.03
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 Hatakeyama Jun;Hasegawa Koji;Sagehashi Masayoshi
分类号 G03F7/039;G03F7/20;G03F7/30;C08F220/30;C08F216/10;C08F220/68;C08F224/00 主分类号 G03F7/039
代理机构 Westerman, Hattori, Daniels & Adrian, LLP 代理人 Westerman, Hattori, Daniels & Adrian, LLP
主权项 1. A positive resist composition comprising a polymer comprising recurring units having a carboxyl and/or phenolic hydroxyl group substituted with an acid labile group and recurring units (a) having a 2-pyrone ester, represented by the general formula (1), and having a weight average molecular weight of 1,000 to 500,000 as a base resin, wherein R1 is hydrogen or methyl, R2 is methyl or ethyl, and X is (1) a single bond, (2) a C1-C12 linking group having an ester radical, ether radical or lactone ring, (3) phenylene group or (4) naphthylene group.
地址 Tokyo JP