发明名称 POWER MOS TRANSISTOR AND MANUFACTURING METHOD THEREFOR
摘要 A power MOS transistor and a manufacturing method therefor. The power MOS transistor allows a field oxidative stress transition area to be extended by providing a second U-shaped groove (400) at the bottom of a first U-shaped groove (500), thus greatly reducing a leakage current caused by a field oxidative stress and increasing the reliability of a component. The power MOS transistor can have a charge compensation area (205) provided in a drift area (201) at the bottom of the second U-shaped groove (400) and have a super junction structure formed between the charge compensation area (205) and the drift area (201) to increase the breakdown voltage of a high power component. The manufacturing method forms the second U-shaped groove (400) and the charge compensation area (205) by means of a self-alignment process. The process is simple, reliable, and easy to control and allows for reduced manufacturing costs for the power MOS transistor and increased yield thereof.
申请公布号 WO2016011674(A1) 申请公布日期 2016.01.28
申请号 WO2014CN83642 申请日期 2014.08.04
申请人 SU ZHOU ORIENTAL SEMICONDUCTOR CO.,LTD 发明人 LIU, WEI;LIU, LEI;LIN, XI;WANG, PENGFEI;GONG, YI
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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