发明名称 METHODS FOR PROVIDING LITHOGRAPHY FEATURES ON A SUBSTRATE BY SELF-ASSEMBLY OF BLOCK COPOLYMERS
摘要 <p>A method of forming at least one lithography feature, the method comprising: providing at least one lithography recess on a substrate, the or each lithography recess comprising side-walls and a base, with the side-walls having a width therebetween; providing a self-assemblable block copolymer having first and second blocks in the or each lithography recess; causing the self-assemblable block copolymer to self-assemble into an ordered layer within the or each lithography recess, the ordered layer comprising at least a first domain of first blocks and a second domain of second blocks; causing the self-assemblable block copolymer to cross-link in a directional manner; and selectively removing the first domain to form lithography features comprised of the second domain within the or each lithography recess.</p>
申请公布号 WO2015180966(A3) 申请公布日期 2016.01.28
申请号 WO2015EP60620 申请日期 2015.05.13
申请人 ASML NETHERLANDS B.V. 发明人 WUISTER, SANDER, FREDERIK;JEUNINK, ANDRE, BERNARDUS;PEETERS, EMIEL
分类号 G03F7/00 主分类号 G03F7/00
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