发明名称 Colorimeter measurement method and colorimeter for implementing the method
摘要 The present application relates to a colorimeter measurement method and a colorimeter for implementing the method. The method includes the following steps: placing a measured sample on a sample platform; shooting a current image of the sample; determining an intersection angle θ between the sample and a moving direction of the sample platform; adjusting a position of a scanning light spot of a colorimeter according to the angle θ, so that the sample coincides with the moving direction of the sample platform; using the colorimeter to scan the measured sample. By implementing the colorimeter measurement method and the colorimeter of the present application, the sample can be placed optionally when it is measured. Specially, when a design value of a measured sample is approximately equal to a size of the measuring light spot, much time can be saved and manpower waste is avoided.
申请公布号 US9244001(B2) 申请公布日期 2016.01.26
申请号 US201414359578 申请日期 2014.03.28
申请人 SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD. 发明人 Ao Xueli;Zhang Weiwei;Wu Jingming;Xu Rui;Wang Li;He Xiaobo;Zhu Honghui
分类号 G01N21/25;G01J3/46;G01N21/84;G01B11/27 主分类号 G01N21/25
代理机构 代理人
主权项 1. A colorimeter measurement method, comprising the following steps: S1, placing a measured sample on a sample platform; S2, shooting a current image of the sample; S3, calculating a placement angle deviation θ of the sample according to a measurement sequence of the sample and a moving direction of the sample platform; S4, adjusting a position of a scanning light spot of a colorimeter according to the placement angle deviation θ; S5, using the colorimeter to scan the measured sample.
地址 Shenzhen CN