发明名称 |
Resist composition, compound, polymeric compound and method of forming resist pattern |
摘要 |
A resist composition comprising a compound (m0) (wherein Rb1 represents an electron withdrawing group; Rb2 and Rb3 each independently represents an aryl group, an alkyl group or an alkenyl group, provided that Rb2 and Rb3 may be mutually bonded to form a ring with the sulfur atom; and X0− represents a monovalent counteranion).; |
申请公布号 |
US9244347(B2) |
申请公布日期 |
2016.01.26 |
申请号 |
US201414291378 |
申请日期 |
2014.05.30 |
申请人 |
TOKYO OHKA KOGYO CO., LTD. |
发明人 |
Komuro Yoshitaka;Kaiho Takaaki;Hato Toshiaki;Kawaue Akiya;Tsuchiya Junichi;Utsumi Yoshiyuki |
分类号 |
G03F7/004;G03F7/027;G03F7/20;G03F7/038;G03F7/039;C07C309/65;C07C381/12 |
主分类号 |
G03F7/004 |
代理机构 |
Knobbe Martens Olson & Bear LLP |
代理人 |
Knobbe Martens Olson & Bear LLP |
主权项 |
1. A resist comprising:
a base component (A) which exhibits changed solubility in a developing solution under action of acid, a solvent, and an acid generator component (B0) comprising a compound (B0-1) represented by general formula (b0) shown below:wherein Rb1 represents a perfluoroalkyl group of 1 to 4 carbon atoms, a nitro group, a hydroxy group, a cyano group, an acyl group of 1 to 4 carbon atoms or a halogen atom; Rb2 and Rh3 each independently represents an unsubstituted phenyl group; and X1− represents a monovalent counteranion capable of generating a strong acid. |
地址 |
Kawasaki-Shi JP |