发明名称 Apparatus for detecting defect of work
摘要 A defect detecting apparatus detects a defect that is present on the outer circumferential surface of work having the outer circumferential surface thereof formed as a bent surface. The defect detecting apparatus is provided with: a jig which supports the work, and holds the work in a state wherein the work is rotated by a predetermined angle; an image pickup device, which picks up an image of the outer circumferential surface of the work held by the jig, the work being in the state wherein the work is rotated by the predetermined angle; and a controller, which processes an image obtained by means of the image pickup device, and determines a defect. The controller stores information relating to the shape of the outer circumferential surface of the work, and information relating to the positional relationship, at each rotation angle, between the image pickup device and a work area having the image thereof picked up by the image pickup device, and the control apparatus uses the information at the time of determining the defect.
申请公布号 US9247213(B2) 申请公布日期 2016.01.26
申请号 US201114006435 申请日期 2011.03.23
申请人 TOYOTA JIDOSHA KABUSHIKI KAISHA 发明人 Aono Hiroshi
分类号 H04N7/18;G01N21/95;G01N21/952 主分类号 H04N7/18
代理机构 Kenyon & Kenyon LLP 代理人 Kenyon & Kenyon LLP
主权项 1. An apparatus for detecting a defect in an outer surface of a work, comprising: a jig for supporting the work and holding the work rotated at predetermined angles; an image pickup device for taking images of the outer surface of the work which is held at each of the predetermined rotation angles by the jig; and a controller for processing the images obtained by the image pickup device and detecting the defect, wherein the controller stores information about a shape of the outer surface of the work and about a positional relationship between the image pickup device and an imaging area of the work taken by the image pickup device at each of the predetermined rotation angles, and compares a longitudinal dimension of the defect included in the image taken by the image pickup device with a threshold to determine the defect, and wherein the threshold for the use of the determination is changed in response to an image distortion caused by a position of the defect in the image and by a shape of the outer surface of the work in each of the predetermined rotation angles of the work, by using the information about the shape of the outer surface of the work and about the positional relationship between the image pickup device and the imaging area of the work taken by the image pickup device at each of the predetermined rotation angles.
地址 Toyota-Shi JP
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