发明名称 |
Manufacturing method of piezoelectric-body film, and piezoelectric-body film manufactured by the manufacturing method |
摘要 |
A method for manufacturing a piezoelectric thin film including an aluminum nitride thin film containing scandium on a substrate, the method includes: sputtering step for sputtering aluminum and scandium under an atmosphere containing at least a nitrogen gas. In the sputtering step in the method according to the present invention, a scandium content rate falls within the range from 0.5% by atom to 50% by atom when a temperature of the substrate falls within the range from 5° C. to 450° C. during the sputtering step. |
申请公布号 |
US9246461(B2) |
申请公布日期 |
2016.01.26 |
申请号 |
US201013380995 |
申请日期 |
2010.06.30 |
申请人 |
DENSO CORPORATION;NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY |
发明人 |
Akiyama Morito;Kano Kazuhiko;Teshigahara Akihiko |
分类号 |
C23C14/00;H03H3/02;C23C14/06 |
主分类号 |
C23C14/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing a piezoelectric thin film including a substrate on which an aluminum nitride thin film containing scandium is provided, the method comprising:
an aluminum nitride sputtering step for sputtering aluminum and scandium so as to form, directly on the substrate, the aluminum nitride thin film containing scandium, under an atmosphere containing at least a nitrogen gas, a scandium content rate falls within the range from more than 35% by atom to less than 40% by atom when the number of atoms of scandium and the number of atoms of aluminum of the aluminum nitride thin film are 100% by atom in total, the substrate having a temperature within the range from 200° C. to 400° C. during the sputtering step, and wherein the substrate consists of a silicon monocrystal or a silicon monocrystal having a polycrystalline film thereon. |
地址 |
Aichi JP |