发明名称 |
High electron mobility transistors and methods of manufacturing the same |
摘要 |
High electron mobility transistors (HEMTs) including a cavity below a drain and methods of manufacturing HEMTS including removing a portion of a substrate below a drain. |
申请公布号 |
US9245947(B2) |
申请公布日期 |
2016.01.26 |
申请号 |
US201213534730 |
申请日期 |
2012.06.27 |
申请人 |
Samsung Electronics Co., LTD. |
发明人 |
Hwang In-jun;Hong Ki-ha;Oh Jae-joon;Ha Jong-bong;Kim Jong-seob;Choi Hyuk-soon;Shin Jai-kwang |
分类号 |
H01L29/778;H01L21/335;H01L29/06;H01L29/66;H01L21/306;H01L21/3065;H01L29/20 |
主分类号 |
H01L29/778 |
代理机构 |
Harness, Dickey & Pierce P.L.C. |
代理人 |
Harness, Dickey & Pierce P.L.C. |
主权项 |
1. A high electron mobility transistor (HEMT), comprising:
a substrate including a cavity; a first semiconductor layer on the substrate; a second semiconductor layer on the first semiconductor layer; a plurality of sources, a drain, and a plurality of gates on the second semiconductor layer; and an etch stop region around the cavity of the substrate, wherein the etch stop region is a doped region; wherein a hole penetrates the first semiconductor layer and the second semiconductor layer between the cavity and the drain, the hole being an unfilled region connecting the cavity and the drain; and wherein a diameter of the hole is about 10 nm to about 10 μm. |
地址 |
Gyeonggi-do KR |