发明名称 High electron mobility transistors and methods of manufacturing the same
摘要 High electron mobility transistors (HEMTs) including a cavity below a drain and methods of manufacturing HEMTS including removing a portion of a substrate below a drain.
申请公布号 US9245947(B2) 申请公布日期 2016.01.26
申请号 US201213534730 申请日期 2012.06.27
申请人 Samsung Electronics Co., LTD. 发明人 Hwang In-jun;Hong Ki-ha;Oh Jae-joon;Ha Jong-bong;Kim Jong-seob;Choi Hyuk-soon;Shin Jai-kwang
分类号 H01L29/778;H01L21/335;H01L29/06;H01L29/66;H01L21/306;H01L21/3065;H01L29/20 主分类号 H01L29/778
代理机构 Harness, Dickey & Pierce P.L.C. 代理人 Harness, Dickey & Pierce P.L.C.
主权项 1. A high electron mobility transistor (HEMT), comprising: a substrate including a cavity; a first semiconductor layer on the substrate; a second semiconductor layer on the first semiconductor layer; a plurality of sources, a drain, and a plurality of gates on the second semiconductor layer; and an etch stop region around the cavity of the substrate, wherein the etch stop region is a doped region; wherein a hole penetrates the first semiconductor layer and the second semiconductor layer between the cavity and the drain, the hole being an unfilled region connecting the cavity and the drain; and wherein a diameter of the hole is about 10 nm to about 10 μm.
地址 Gyeonggi-do KR