发明名称 Method for forming nitride film using plasma process
摘要 Disclosed is a method of forming a nitride film on an object to be processed (“processed object”). The method includes a step (step (a)) of exposing the processed object to dichlorosilane which is a precursor gas and a step (step (b)) of exposing the processed object to plasma of a processing gas which includes an ammonia gas and a hydrogen gas after step (a). Alternatively, step (a) and step (b) may be alternately repeated and a step of removing dichlorosilane (step (c)) may be further provided between step (a) and step (b).
申请公布号 US9245741(B2) 申请公布日期 2016.01.26
申请号 US201414187404 申请日期 2014.02.24
申请人 TOKYO ELECTRON LIMITED 发明人 Karakawa Takayuki
分类号 H01L21/00;H01L21/02;C23C16/34;C23C16/455;C23C16/511 主分类号 H01L21/00
代理机构 Rothwell, Figg, Ernst & Manbeck, P.C. 代理人 Rothwell, Figg, Ernst & Manbeck, P.C.
主权项 1. A method of forming a nitride film on an object to be processed, the method comprising: exposing the object to be processed to dichlorosilane which is a precursor gas so that a dichlorosilane based first reactant is chemisorbed onto the object to be processed; exposing the object to be processed to plasma of a processing gas which includes an ammonia gas and a hydrogen gas after the exposing of the object to be processed to the dichlorosilane; exciting each of the hydrogen gas and the ammonia gas thereby generating a hydrogen radical and an ammonia radical; removing a chlorine in the first reactant through a hydrogen substitution reaction of the first reactant and the hydrogen radical thereby generating a second reactant; and performing a nitriding reaction of the second reactant and the ammonia radical thereby generating the nitride film.
地址 Tokyo JP