发明名称 |
Method for forming nitride film using plasma process |
摘要 |
Disclosed is a method of forming a nitride film on an object to be processed (“processed object”). The method includes a step (step (a)) of exposing the processed object to dichlorosilane which is a precursor gas and a step (step (b)) of exposing the processed object to plasma of a processing gas which includes an ammonia gas and a hydrogen gas after step (a). Alternatively, step (a) and step (b) may be alternately repeated and a step of removing dichlorosilane (step (c)) may be further provided between step (a) and step (b). |
申请公布号 |
US9245741(B2) |
申请公布日期 |
2016.01.26 |
申请号 |
US201414187404 |
申请日期 |
2014.02.24 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
Karakawa Takayuki |
分类号 |
H01L21/00;H01L21/02;C23C16/34;C23C16/455;C23C16/511 |
主分类号 |
H01L21/00 |
代理机构 |
Rothwell, Figg, Ernst & Manbeck, P.C. |
代理人 |
Rothwell, Figg, Ernst & Manbeck, P.C. |
主权项 |
1. A method of forming a nitride film on an object to be processed, the method comprising:
exposing the object to be processed to dichlorosilane which is a precursor gas so that a dichlorosilane based first reactant is chemisorbed onto the object to be processed; exposing the object to be processed to plasma of a processing gas which includes an ammonia gas and a hydrogen gas after the exposing of the object to be processed to the dichlorosilane; exciting each of the hydrogen gas and the ammonia gas thereby generating a hydrogen radical and an ammonia radical; removing a chlorine in the first reactant through a hydrogen substitution reaction of the first reactant and the hydrogen radical thereby generating a second reactant; and performing a nitriding reaction of the second reactant and the ammonia radical thereby generating the nitride film. |
地址 |
Tokyo JP |