发明名称 |
Apparatus for measuring specular reflectance of a sample |
摘要 |
<p>An accessory for a spectrometer for carrying out measurements of specular reflectance of a sample. The accessory is designed so that all components can be located in a housing and the sample can be located horizontally on a top-plate of the housing with the components disposed below the plane of that plate. An assembly of components comprising a sample location, optical elements for directing analysing radiation to said sample location and a detector for receiving radiation reflected from the sample. <IMAGE></p> |
申请公布号 |
EP1939595(B1) |
申请公布日期 |
2016.01.20 |
申请号 |
EP20080075194 |
申请日期 |
2004.01.20 |
申请人 |
PERKINELMER SINGAPORE PTE LIMITED |
发明人 |
HOULT, ROBERT ALAN;EVETTS, PAUL ALEXANDER |
分类号 |
G01J3/44;G01J3/42;G01N21/55 |
主分类号 |
G01J3/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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