发明名称 Apparatus for measuring specular reflectance of a sample
摘要 <p>An accessory for a spectrometer for carrying out measurements of specular reflectance of a sample. The accessory is designed so that all components can be located in a housing and the sample can be located horizontally on a top-plate of the housing with the components disposed below the plane of that plate. An assembly of components comprising a sample location, optical elements for directing analysing radiation to said sample location and a detector for receiving radiation reflected from the sample. <IMAGE></p>
申请公布号 EP1939595(B1) 申请公布日期 2016.01.20
申请号 EP20080075194 申请日期 2004.01.20
申请人 PERKINELMER SINGAPORE PTE LIMITED 发明人 HOULT, ROBERT ALAN;EVETTS, PAUL ALEXANDER
分类号 G01J3/44;G01J3/42;G01N21/55 主分类号 G01J3/44
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