TEST SYSTEM FOR TESTING DEVICES BASED ON A VARIOUS SUDDEN POWER LOSS SITUATIONS

摘要

The present invention relates to a test system for automatically testing test targets by implementing various voltage dip situations. The test system includes: a host apparatus which provides a user interface for selecting test items and setting test conditions regarding the selected test items and controls the occurrence of the voltage dip regarding the test targets according to the information input through the user interface; a test unit which uses the data stored in the test targets according to a control signal from the host apparatus to execute the operation of the test items; and a power control unit which controls the power supply to the test targets and a test board according to the control signal from the host apparatus.