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发明名称
半导体装置及其制造方法
摘要
明的课题是在于提升半导体装置的可靠度。 其解决手段,实施形态的特征点是在焊垫PD与拉出配线部DWU的连接部位设置倾斜部SLP的点。藉此,可抑制在藉由表面保护膜PAS来被覆焊垫PD的一部分的被覆领域发生龟裂的情形。
申请公布号
TW201603209
申请公布日期
2016.01.16
申请号
TW104110430
申请日期
2015.03.31
申请人
瑞萨电子股份有限公司
发明人
冨田和朗;竹若博基
分类号
H01L23/31(2006.01)
主分类号
H01L23/31(2006.01)
代理机构
代理人
林志刚
主权项
一种半导体装置,其特征系具备矩形形状的半导体晶片,前述半导体晶片系具有:(a)沿着前述半导体晶片的端边而配置之复数的焊垫;(b)分别设在前述复数的焊垫之拉出配线部;及(c)设在各前述复数的焊垫与前述拉出配线部的连接部位之倾斜部。
地址
日本
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