| 摘要 |
This viscoelastic measuring device (1) comprises: a sample deformation unit (11) that applies external force to, and periodically deforms, a measuring sample (S); a first viscoelastic property calculation unit (15) that calculates the low-frequency viscoelastic properties of the measuring sample (S) on the basis of the stress acting on the measuring sample (S) that has been deformed by the sample deformation unit (11) and the distortion of the measuring sample (S); a radiating unit (12) that radiates incident sound waves to the measuring sample (S); a receiving unit (12) that receives reflected sound waves that are generated when the incident sound waves that are radiated by the radiating unit (25) are reflected by the measuring sample (S), or transmitted sound waves formed by the incident sound waves being transmitted through the measuring sample (S); and a second viscoelastic property calculation unit (15) that calculates the high-frequency viscoelastic properties of the measuring sample (S) in the frequency of the incident sound waves, on the basis of the reflected sound waves or the transmitted sound waves received by the receiving unit (25). |
