发明名称 |
APPARATUS FOR THE ABSOLUTE MEASUREMENT OF TWO DIMENSIONAL OPTICAL PATH DISTRIBUTIONS USING INTERFEROMETRY |
摘要 |
<p>An apparatus for the absolute measurement of a two dimensional optical path distribution comprising: a light source (4) for illuminating an object (26) with light having a plurality of wavelengths: an interferometer (12) for forming an image of at least part of the object, which image comprises a broad band interferogram; a hyperspectral imager (30) in optical communication with the interferometer for spectrally separating the broad band interferogram into a plurality of narrow band two dimensional interferograms (72, 74, 76); a register (38) for spatially registering the narrow band interferograms; an extractor for extracting one dimensional intensity signals from corresponding pixels in each narrow band interferogram; and a calculator (100) for calculating the frequency for each point on the object from a one dimensional intensity signal associated with that point.</p> |
申请公布号 |
EP2459958(B1) |
申请公布日期 |
2016.01.13 |
申请号 |
EP20100749891 |
申请日期 |
2010.07.20 |
申请人 |
LOUGHBOROUGH UNIVERSITY |
发明人 |
HUNTLEY, JONATHAN MARK;RUIZ, PABLO DANIEL;WIDJANARKO, TAUFIQ |
分类号 |
G01B9/02;G01B11/24 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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