发明名称 YIELD VERIFICATION METHOD, YIELD VERIFICATION PROGRAM, AND YIELD VERIFICATION DEVICE FOR POST LAYOUT CIRCUIT
摘要 PROBLEM TO BE SOLVED: To achieve the efficiency of the yield verification of a post-layout circuit by performing the necessary number of times of simulation with respect to requested accuracy.SOLUTION: A computer executes a process (step A3) of executing post-layout simulation one time; a process (step S4) of calculating difference data between performance variation data by pre-layout simulation and the post-layout simulation; process (step A5) of calculating yield prediction accuracy by using the difference data; a process (step A6) of determining whether or not the yield prediction accuracy has reached requested accuracy; and a process (step A8) of repeatedly executing the post-layout simulation execution process, the difference data calculation process, the yield prediction accuracy calculation process and the determination process until it is determined that the yield prediction accuracy has reached the requested accuracy, and calculating a yield predictive value when it is determined that the yield prediction accuracy has reached the requested accuracy.
申请公布号 JP2016004421(A) 申请公布日期 2016.01.12
申请号 JP20140124387 申请日期 2014.06.17
申请人 FUJITSU LTD 发明人 LIU YU
分类号 G06F17/50 主分类号 G06F17/50
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