| 发明名称 |
SCAN CHAIN CIRCUIT AND INTEGRATED CIRCUIT INCLUDING THE SAME |
| 摘要 |
A scan chain circuit includes first through N-th flip-flops connected in series to sequentially transfer data in response to a control signal, where N is an integer greater than 1. In the first through N-th flip-flops, the data are transferred in a first direction from the first flip-flop to the N-th flip-flop. The control signal is applied to the first through N-th flip-flops in a second direction opposite to the first direction from the N-th flip-flop to the first flip-flop. |
| 申请公布号 |
US2016003901(A1) |
申请公布日期 |
2016.01.07 |
| 申请号 |
US201514706224 |
申请日期 |
2015.05.07 |
| 申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK In-Gyu;SEO Dong-Wook;LEE Chan-Ho |
| 分类号 |
G01R31/3177;G01R31/317;H03K3/037 |
主分类号 |
G01R31/3177 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A scan chain circuit comprising:
first through N-th flip-flops connected in series to sequentially transfer data in response to a control signal, where N is an integer greater than 1, wherein, in the first through N-th flip-flops, the data are transferred in a first direction from the first flip-flop to the N-th flip-flop, and wherein the control signal is applied to the first through N-th flip-flops in a second direction opposite to the first direction from the N-th flip-flop to the first flip-flop. |
| 地址 |
Suwon-si KR |
