发明名称 |
Memory test system and method |
摘要 |
An exemplary embodiment of the present disclosure illustrates a memory test system comprising a memory device, a probe card, and a tester. The memory device comprises a memory die with a plurality of memory banks, a plurality of input circuits, and a plurality of output circuits, wherein each of the input circuits has a first input pin and a second pin, the first input pins of the input circuits are used to read a plurality of patches of data stored in memory cells of the memory banks, and the second input pins are used to receive a compressed result. The output circuits receive compressed signals output from the input circuits, and the probe card mixes the compressed output signals output from the output circuits to output a mixed compressed output signal to the tester. |
申请公布号 |
US9229059(B2) |
申请公布日期 |
2016.01.05 |
申请号 |
US201314099318 |
申请日期 |
2013.12.06 |
申请人 |
ELITE SEMICONDUCTOR MEMORY TECHNOLOGY INC. |
发明人 |
Chou Min-Chung |
分类号 |
G01R31/319;G11C29/48;G11C29/26;G11C29/00;G11C29/56;G11C29/12;G11C29/40;G11C29/10;G11C29/36 |
主分类号 |
G01R31/319 |
代理机构 |
Li & Cai Intellectual Property (USA) Office |
代理人 |
Li & Cai Intellectual Property (USA) Office |
主权项 |
1. A memory test system, comprising:
a memory device, comprising a memory die with a plurality of memory banks, a plurality of input circuits, and a plurality of output circuits, wherein each of the input circuits has a first input pin and a second pin, the first input pins of the input circuits are used to read a plurality of patches of data stored in memory cells of the memory banks, and the second input pins are used to receive a compressed result; a probe card, electrically connected to the output circuits; and a tester, electrically connected to the probe card; wherein the output circuits receive compressed signals output from the input circuits, and the probe card mixes compressed output signals output from the output circuits to output a mixed compressed output signal to the tester. |
地址 |
Hsinchu TW |