发明名称 Test device and method
摘要 A test device is provided for testing a device under test (DUT) having a control interface compliant with a standard selected from a plurality of standards each supporting a common set of management data input/output (MDIO) and non-MDIO control signals. The test device includes a test interface and an integrated control interface. The integrated control interface adapts to the standard with which the control interface of the DUT complies, so that the integrated control interface directly and fully controls the DUT via at least the common set of MDIO and non-MDIO control signals. The integrated control interface exchanges control signals selected from the common set of MDIO and non-MDIO control signals with the control interface of the DUT to monitor the DUT and thereby obtain status information about the DUT.
申请公布号 US9229831(B2) 申请公布日期 2016.01.05
申请号 US201414194301 申请日期 2014.02.28
申请人 Viavi Solutions Deutschland GmbH 发明人 Schnizler Reiner;Brooks Paul
分类号 G06F11/00;G06F11/273;H04L12/26;H04L1/24 主分类号 G06F11/00
代理机构 Mannava & Kang, P.C. 代理人 Mannava & Kang, P.C.
主权项 1. A method of testing a device under test (DUT) having a control interface compliant with a standard selected from a plurality of standards each supporting a common set of management data input/output (MDIO) and non-MDIO control signals, the method comprising: coupling the DUT to a test device comprising a test interface and an integrated control interface, by coupling a data interface of the DUT to the test interface of the test device, and by coupling the control interface of the DUT to the integrated control interface of the test device; adapting the integrated control interface of the test device to the standard with which the control interface of the DUT complies, so that the integrated control interface of the test device directly and fully controls the DUT via at least the common set of MDIO and non-MDIO control signals; performing a test on the DUT, by exchanging test data signals between the data interface of the DUT and the test interface of the test device, to obtain test results; and monitoring the DUT throughout the test, by exchanging control signals selected from the common set of MDIO and non-MDIO control signals between the control interface of the DUT and the integrated control interface of the test device, to obtain status information about the DUT.
地址 Eningen DE