发明名称 Accuracy management method
摘要 There is provided a comprehensive accuracy management method attained by including the steps of: displaying operation event information in time series in an accuracy management result chart or a calibration result chart on the same screen; accumulating a characteristic daily measurement value fluctuation pattern on the basis of a kind of an operation event; displaying the latest fluctuation pattern of measurement results and the daily measurement value fluctuation pattern in superposition with each other to warn of fluctuations which differ from the daily measurement value fluctuation pattern; and estimating and reporting the cause of the fluctuations.
申请公布号 US9229015(B2) 申请公布日期 2016.01.05
申请号 US200913141984 申请日期 2009.11.19
申请人 Hitachi High-Technologies Corporation 发明人 Li Qing;Mimura Tomonori;Fukuzono Shinichi;Ishii Naomi
分类号 G01N35/00;G01D18/00;G01N35/02 主分类号 G01N35/00
代理机构 Miles & Stockbridge PC 代理人 Miles & Stockbridge PC
主权项 1. An accuracy management method comprising: a measurement step for repetitively measuring a sample at specified intervals; a measurement result storing step for storing a plurality of measurement results measured in the measurement step; a fluctuation pattern extraction step for extracting a fluctuation pattern for at least one inspection item based on a change with time in the measurement results stored in the storing step and an operation event including at least one of changing a lot or vial of an accuracy management material, changing a lot or bottle of a reagent, changing a lot or vial of a calibrator, executing calibration, executing maintenance, or generating an alarm; and a fluctuation pattern storing step for storing the fluctuation patterns extracted in the fluctuation pattern extraction step.
地址 Tokyo JP