发明名称 NITRIDE SEMICONDUCTOR LAYER, NITRIDE SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING NITRIDE SEMICONDUCTOR LAYER
摘要 According to one embodiment, a nitride semiconductor layer spreading along a first surface is provided. The nitride semiconductor layer includes a first region and a second region. A length of the first region in a first direction parallel to the first surface is longer than a length of the first region in a second direction parallel to the first surface and perpendicular to the first direction. The second region is arranged with the first region in the second direction. A length of the second region in the first direction is longer than a length of the second region in the second direction. A c-axis being is tilted with respect to the second direction for the first region and the second region. The c-axis intersects a third direction perpendicular to the first surface.
申请公布号 US2015380495(A1) 申请公布日期 2015.12.31
申请号 US201514701621 申请日期 2015.05.01
申请人 Kabushiki Kaisha Toshiba 发明人 HIKOSAKA Toshiki;ONO Hiroshi;NUNOUE Shinya
分类号 H01L29/20;H01L29/04;H01L21/02;H01L33/32;H01L33/06;H01L33/24;H01L33/00;H01L29/15;H01S5/343;H01L31/0304;H01L31/0352;H01L31/18;H01L29/78;H01L29/737;H01L29/872;H01L29/66;H01L29/778 主分类号 H01L29/20
代理机构 代理人
主权项 1. A nitride semiconductor layer spreading along a first surface, the nitride semiconductor layer comprising: a first region, a length of the first region in a first direction parallel to the first surface being longer than a length of the first region in a second direction parallel to the first surface and perpendicular to the first direction; and a second region arranged with the first region in the second direction, a length of the second region in the first direction being longer than a length of the second region in the second direction, a c-axis being tilted with respect to the second direction for the first region and the second region, the c-axis intersecting a third direction perpendicular to the first surface.
地址 Minato-ku JP
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